Lower gate oxide failure rates during the lifetime and no early failures translate into the highest possible gate oxide quality with the customer side. Browse all about how Infineon controls and assures the reliability of SiC based power semiconductors during the release process to realize the specified lifetime and quality https://www.facebook.com/permalink.php?story_fbid=pfbid037Dfp8cqWvqpeXFQqMHNGdqGR68LK3JYQ51ToVXC82Cme4MVEEXeitoKYjLvzUaGUl&id=61562415773754&__cft__[0]=AZXstENLU_wRxbyOJhvGeBoYTbR6-TrYi0pcW6FBNtQVWVvg-aOGvfppvGvt7C3GChSMUEb1eEw-nMkzxy_IHnQUdBCgtewKzXM1pldcYb_UNAw5IFU32a_E6-rVNUOOic6SAw3j5wFT0b7hRf2kQuKtXppkeYg6MgAkAFk23fkHC19Ho-8PCloXp0MeAQgm9jlNGeOqcuM_Jhje4E2Tnk82&__tn__=%2CO%2CP-R